Bibliography

BWR19

Patrick T Brewick, Stuart Wright, and David J Rowenhorst. NLPAR: Non-local smoothing for enhanced EBSD pattern indexing. Ultramicroscopy, 200:50–61, 2019. doi:10.1016/j.ultramic.2019.02.013.

BJG+16

T. B. Britton, J. Jiang, Y. Guo, A. Vilalta-Clemente, D. Wallis, L. N. Hansen, A. Winkelmann, and A. J. Wilkinson. Tutorial: Crystal orientations and EBSD - Or which way is up? Materials Characterization, 117:113–126, 2016. URL: http://dx.doi.org/10.1016/j.matchar.2016.04.008, doi:10.1016/j.matchar.2016.04.008.

CDeGraef13

Patrick G Callahan and Marc De Graef. Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations. Microscopy and Microanalysis, pages 1255–1265, 2013. doi:10.1017/S1431927613001840.

CPW+15

Yu H. Chen, Se Un Park, Dennis Wei, Greg Newstadt, Michael A. Jackson, Jeff P. Simmons, Marc De Graef, and Alfred O. Hero. A Dictionary Approach to Electron Backscatter Diffraction Indexing. Microscopy and Microanalysis, 21(3):739–752, 2015. doi:10.1017/S1431927615000756.

FCWB19

Alexander Foden, David M Collins, Angus J Wilkinson, and T Benjamin Britton. Indexing electron backscatter diffraction patterns with a refined template matching approach. Ultramicroscopy, 207:112845, 2019. doi:10.1016/j.ultramic.2019.112845.

GW17

Rafael C Gonzalez and Richard E Woods. Digital Image Processing. Pearson Education Limited, 4th edition, 2017. ISBN 978-0133356724.

Gos12

A Ardeshir Goshtasby. Image registration: Principles, tools and methods. Springer Science & Business Media, 2012.

JGU+14

Michael A Jackson, Michael A Groeber, Michael D Uchic, David J Rowenhorst, and Marc De Graef. h5ebsd: an archival data format for electron back-scatter diffraction data sets. Integrating Materials and Manufacturing Innovation, 3(1):4, 2014. doi:10.1186/2193-9772-3-4.

JPDeGraef19

Michael A. Jackson, Elena Pascal, and Marc De Graef. Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: a Hands-On Tutorial. Integrating Materials and Manufacturing Innovation, pages 1–21, 2019. doi:10.1007/s40192-019-00137-4.

Las94

Niels Christian Krieger Lassen. Automated Determanation of Crystal Orientations from Electron Backscattering Patterns. PhD thesis, Institute of Mathematical Modelling, 1994.

MDeGraefS+17

Katharina Marquardt, Marc De Graef, Saransh Singh, Hauke Marquardt, Anja Rosenthal, and Sanae Koizuimi. Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: Overcoming indexing difficulties on geological materials. American Mineralogist, 102(9):1843–1855, 2017. doi:10.2138/am-2017-6062.

NHW17

Gert Nolze, Ralf Hielscher, and Aimo Winkelmann. Electron backscatter diffraction beyond the mainstream. Crystal Research and Technology, 52(1):1–24, 2017. doi:10.1002/crat.201600252.

NWB16

Gert Nolze, Aimo Winkelmann, and Alan P Boyle. Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction. Ultramicroscopy, 160:146–154, 2016. doi:10.1016/j.ultramic.2015.10.010.

SRDeGraef17

Saransh Singh, Farangis Ram, and Marc De Graef. Application of forward models to crystal orientation refinement. Journal of Applied Crystallography, 50(6):1664–1676, 2017. doi:10.1107/S1600576717014200.

WNL+15

Stuart I. Wright, Matthew M. Nowell, Scott P. Lindeman, Patrick P. Camus, Marc De Graef, and Michael A. Jackson. Introduction and comparison of new EBSD post-processing methodologies. Ultramicroscopy, 159:81–94, 2015. doi:10.1016/j.ultramic.2015.08.001.

WNDeKloe+15

Stuart I. Wright, Matthew M. Nowell, René De Kloe, Patrick Camus, and Travis Rampton. Electron imaging with an EBSD detector. Ultramicroscopy, 148:132–145, 2015. URL: http://dx.doi.org/10.1016/j.ultramic.2014.10.002, doi:10.1016/j.ultramic.2014.10.002.

AHvHM19

H. W Ånes, J. Hjelen, A. T. J. van Helvoort, and K. Marthinsen. Electron backscatter patterns from Nickel acquired with varying camera gain. Zenodo, 2019. [Data set]. doi:10.5281/zenodo.3265037.

AHS+20

HW Ånes, J Hjelen, BE Sørensen, ATJ van Helvoort, and K Marthinsen. Processing and indexing of electron backscatter patterns using open-source software. In IOP Conference Series: Materials Science and Engineering, volume 891, 012002. IOP Publishing, 2020. doi:10.1088/1757-899X/891/1/012002.