Bibliography

CDeGraef13

Patrick G Callahan and Marc De Graef. Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations. Microscopy and Microanalysis, pages 1255–1265, 2013. doi:10.1017/S1431927613001840.

CPW+15

Yu H. Chen, Se Un Park, Dennis Wei, Greg Newstadt, Michael A. Jackson, Jeff P. Simmons, Marc De Graef, and Alfred O. Hero. A Dictionary Approach to Electron Backscatter Diffraction Indexing. Microscopy and Microanalysis, 21(3):739–752, 2015. doi:10.1017/S1431927615000756.

GW17

Rafael C Gonzalez and Richard E Woods. Digital Image Processing. Pearson Education Limited, 4th edition, 2017. ISBN 978-0133356724.

Gos12

A Ardeshir Goshtasby. Image registration: Principles, tools and methods. Springer Science & Business Media, 2012.

JGU+14

Michael A Jackson, Michael A Groeber, Michael D Uchic, David J Rowenhorst, and Marc De Graef. h5ebsd: an archival data format for electron back-scatter diffraction data sets. Integrating Materials and Manufacturing Innovation, 3(1):4, 2014. doi:10.1186/2193-9772-3-4.

JPDeGraef19

Michael A. Jackson, Elena Pascal, and Marc De Graef. Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: a Hands-On Tutorial. Integrating Materials and Manufacturing Innovation, pages 1–21, 2019. doi:10.1007/s40192-019-00137-4.

Las94

Niels Christian Krieger Lassen. Automated Determanation of Crystal Orientations from Electron Backscattering Patterns. PhD thesis, Institute of Mathematical Modelling, 1994.

MDeGraefS+17

Katharina Marquardt, Marc De Graef, Saransh Singh, Hauke Marquardt, Anja Rosenthal, and Sanae Koizuimi. Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: Overcoming indexing difficulties on geological materials. American Mineralogist, 102(9):1843–1855, 2017. doi:10.2138/am-2017-6062.

WNL+15

Stuart I. Wright, Matthew M. Nowell, Scott P. Lindeman, Patrick P. Camus, Marc De Graef, and Michael A. Jackson. Introduction and comparison of new EBSD post-processing methodologies. Ultramicroscopy, 159:81–94, 2015. doi:10.1016/j.ultramic.2015.08.001.