Patrick T. Brewick, Stuart I. Wright, and David J. Rowenhorst. NLPAR: Non-local smoothing for enhanced EBSD pattern indexing. Ultramicroscopy, 200:50–61, 2019. doi:10.1016/j.ultramic.2019.02.013.


T. B. Britton, J. Jiang, Y. Guo, A. Vilalta-Clemente, D. Wallis, L. N. Hansen, Aimo Winkelmann, and Angus J. Wilkinson. Tutorial: Crystal orientations and EBSD - Or which way is up? Materials Characterization, 117:113–126, 2016. doi:10.1016/j.matchar.2016.04.008.


Patrick G. Callahan and Marc De Graef. Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations. Microscopy and Microanalysis, pages 1255–1265, 2013. doi:10.1017/S1431927613001840.


Yu H. Chen, Se Un Park, Dennis Wei, Greg Newstadt, Michael A. Jackson, Jeff P. Simmons, Marc De Graef, and Alfred O. Hero. A Dictionary Approach to Electron Backscatter Diffraction Indexing. Microscopy and Microanalysis, 21(3):739–752, 2015. doi:10.1017/S1431927615000756.


Alexander Foden, David M. Collins, Angus J. Wilkinson, and Thomas B. Britton. Indexing electron backscatter diffraction patterns with a refined template matching approach. Ultramicroscopy, 207:112845, 2019. doi:10.1016/j.ultramic.2019.112845.


Rafael C. Gonzalez and Richard E. Woods. Digital Image Processing. Pearson Education Limited, 4th edition, 2017. ISBN 978-0133356724.


Ardeshir A. Goshtasby. Image registration: Principles, tools and methods. Springer Science & Business Media, 2012.


Jarle Hjelen, Eivind Hoel, and Roar Ørsund. Electron diffraction in the SEM. Micron and Microscopica Acta, 22(1-2):137–138, 1991. doi:10.1016/0739-6260(91)90128-M.


Michael A. Jackson, Michael A. Groeber, Michael D. Uchic, David J. Rowenhorst, and Marc De Graef. h5ebsd: an archival data format for electron back-scatter diffraction data sets. Integrating Materials and Manufacturing Innovation, 3(1):4, 2014. doi:10.1186/2193-9772-3-4.


Michael A. Jackson, Elena Pascal, and Marc De Graef. Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: a Hands-On Tutorial. Integrating Materials and Manufacturing Innovation, pages 1–21, 2019. doi:10.1007/s40192-019-00137-4.


Niels Christian Krieger Lassen. Automated Determanation of Crystal Orientations from Electron Backscattering Patterns. PhD thesis, Institute of Mathematical Modelling, 1994.


Katharina Marquardt, Marc De Graef, Saransh Singh, Hauke Marquardt, Anja Rosenthal, and Sanae Koizuimi. Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: Overcoming indexing difficulties on geological materials. American Mineralogist, 102(9):1843–1855, 2017. doi:10.2138/am-2017-6062.


Gert Nolze, Ralf Hielscher, and Aimo Winkelmann. Electron backscatter diffraction beyond the mainstream. Crystal Research and Technology, 52(1):1–24, 2017. doi:10.1002/crat.201600252.


Gert Nolze, Aimo Winkelmann, and Alan P. Boyle. Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction. Ultramicroscopy, 160:146–154, 2016. doi:10.1016/j.ultramic.2015.10.010.


Edward L. Pang, Peter M. Larsen, and Christopher A. Schuh. Global optimization for accurate determination of ebsd pattern centers. Ultramicroscopy, 209:112876, 2020. doi:10.1016/j.ultramic.2019.112876.


S. Singh and Marc De Graef. Orientation sampling for dictionary-based diffraction pattern indexing methods. Modelling and Simulation in Materials Science and Engineering, 2016. doi:10.1088/0965-0393/24/8/085013.


Saransh Singh, Farangis Ram, and Marc De Graef. Application of forward models to crystal orientation refinement. Journal of Applied Crystallography, 50(6):1664–1676, 2017. doi:10.1107/S1600576717014200.


Angus J. Wilkinson, Graham Meaden, and David J. Dingley. High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity. Ultramicroscopy, 106(4-5):307–313, 2006. doi:10.1016/j.ultramic.2005.10.001.


Aimo Winkelmann, Gert Nolze, Grzegorz Cios, Tomasz Tokarski, and Piotr Bała. Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps. Materials, 13(12):2816, 2020. doi:10.3390/ma13122816.


Stuart I. Wright, Matthew M. Nowell, Scott P. Lindeman, Patrick P. Camus, Marc De Graef, and Michael A. Jackson. Introduction and comparison of new EBSD post-processing methodologies. Ultramicroscopy, 159:81–94, 2015. doi:10.1016/j.ultramic.2015.08.001.


Stuart I. Wright, Matthew M. Nowell, René De Kloe, Patrick Camus, and Travis Rampton. Electron imaging with an EBSD detector. Ultramicroscopy, 148:132–145, 2015. doi:10.1016/j.ultramic.2014.10.002.


HW Ånes, J Hjelen, BE Sørensen, ATJ van Helvoort, and K Marthinsen. Processing and indexing of electron backscatter patterns using open-source software. In IOP Conference Series: Materials Science and Engineering, volume 891, 012002. IOP Publishing, 2020. doi:10.1088/1757-899X/891/1/012002.


Håkon W. Ånes, Jarle Hjelen, Antonius T. J. van Helvoort, and Knut Marthinsen. Electron backscatter patterns from Nickel acquired with varying camera gain. Zenodo, 2019. [Data set]. doi:10.5281/zenodo.3265037.