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[BWR19]

Patrick T. Brewick, Stuart I. Wright, and David J. Rowenhorst. NLPAR: Non-local smoothing for enhanced EBSD pattern indexing. Ultramicroscopy, 200:50–61, 2019. doi:10.1016/j.ultramic.2019.02.013.

[BJG+16]

T. B. Britton, J. Jiang, Y. Guo, A. Vilalta-Clemente, D. Wallis, L. N. Hansen, Aimo Winkelmann, and Angus J. Wilkinson. Tutorial: Crystal orientations and EBSD - Or which way is up? Materials Characterization, 117:113–126, 2016. doi:10.1016/j.matchar.2016.04.008.

[CDeGraef13]

Patrick G. Callahan and Marc De Graef. Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations. Microscopy and Microanalysis, pages 1255–1265, 2013. doi:10.1017/S1431927613001840.

[CPW+15]

Yu H. Chen, Se Un Park, Dennis Wei, Greg Newstadt, Michael A. Jackson, Jeff P. Simmons, Marc De Graef, and Alfred O. Hero. A Dictionary Approach to Electron Backscatter Diffraction Indexing. Microscopy and Microanalysis, 21(3):739–752, 2015. doi:10.1017/S1431927615000756.

[FCWB19]

Alexander Foden, David M. Collins, Angus J. Wilkinson, and Thomas B. Britton. Indexing electron backscatter diffraction patterns with a refined template matching approach. Ultramicroscopy, 207:112845, 2019. doi:10.1016/j.ultramic.2019.112845.

[GW17]

Rafael C. Gonzalez and Richard E. Woods. Digital Image Processing. Pearson Education Limited, 4th edition, 2017. ISBN 978-0133356724.

[Gos12]

Ardeshir A. Goshtasby. Image registration: Principles, tools and methods. Springer Science & Business Media, 2012.

[HH91]

Jarle Hjelen, Eivind Hoel, and Roar Ørsund. Electron diffraction in the SEM. Micron and Microscopica Acta, 22(1-2):137–138, 1991. doi:10.1016/0739-6260(91)90128-M.

[JGU+14]

Michael A. Jackson, Michael A. Groeber, Michael D. Uchic, David J. Rowenhorst, and Marc De Graef. h5ebsd: an archival data format for electron back-scatter diffraction data sets. Integrating Materials and Manufacturing Innovation, 3(1):4, 2014. doi:10.1186/2193-9772-3-4.

[JPDeGraef19]

Michael A. Jackson, Elena Pascal, and Marc De Graef. Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: a Hands-On Tutorial. Integrating Materials and Manufacturing Innovation, pages 1–21, 2019. doi:10.1007/s40192-019-00137-4.

[Kir98]

Earl J Kirkland. Advanced computing in electron microscopy. Volume 12. Springer, 1998. doi:10.1007/978-1-4757-4406-4.

[Las94]

Niels Christian Krieger Lassen. Automated Determanation of Crystal Orientations from Electron Backscattering Patterns. PhD thesis, Institute of Mathematical Modelling, 1994.

[LVanDyck14]

Ivan Lobato and Dirk Van Dyck. An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints. Acta Crystallographica Section A: Foundations and Advances, 70(6):636–649, 2014. doi:10.1107/S205327331401643X.

[MDeGraefS+17]

Katharina Marquardt, Marc De Graef, Saransh Singh, Hauke Marquardt, Anja Rosenthal, and Sanae Koizuimi. Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: Overcoming indexing difficulties on geological materials. American Mineralogist, 102(9):1843–1855, 2017. doi:10.2138/am-2017-6062.

[NHW17]

Gert Nolze, Ralf Hielscher, and Aimo Winkelmann. Electron backscatter diffraction beyond the mainstream. Crystal Research and Technology, 52(1):1–24, 2017. doi:10.1002/crat.201600252.

[NWB16]

Gert Nolze, Aimo Winkelmann, and Alan P. Boyle. Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction. Ultramicroscopy, 160:146–154, 2016. doi:10.1016/j.ultramic.2015.10.010.

[PLS20]

Edward L. Pang, Peter M. Larsen, and Christopher A. Schuh. Global optimization for accurate determination of EBSD pattern centers. Ultramicroscopy, 209:112876, 2020. doi:10.1016/j.ultramic.2019.112876.

[SRDeGraef17]

Saransh Singh, Farangis Ram, and Marc De Graef. Application of forward models to crystal orientation refinement. Journal of Applied Crystallography, 50(6):1664–1676, 2017. doi:10.1107/S1600576717014200.

[SDeGraef16]

Saransh Singh and Marc De Graef. Orientation sampling for dictionary-based diffraction pattern indexing methods. Modelling and Simulation in Materials Science and Engineering, 2016. doi:10.1088/0965-0393/24/8/085013.

[WMD06]

Angus J. Wilkinson, Graham Meaden, and David J. Dingley. High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity. Ultramicroscopy, 106(4-5):307–313, 2006. doi:10.1016/j.ultramic.2005.10.001.

[WNC+20]

Aimo Winkelmann, Gert Nolze, Grzegorz Cios, Tomasz Tokarski, and Piotr Bała. Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps. Materials, 13(12):2816, 2020. doi:10.3390/ma13122816.

[WNL+15]

Stuart I. Wright, Matthew M. Nowell, Scott P. Lindeman, Patrick P. Camus, Marc De Graef, and Michael A. Jackson. Introduction and comparison of new EBSD post-processing methodologies. Ultramicroscopy, 159:81–94, 2015. doi:10.1016/j.ultramic.2015.08.001.

[WNDeKloe+15]

Stuart I. Wright, Matthew M. Nowell, René De Kloe, Patrick Camus, and Travis Rampton. Electron imaging with an EBSD detector. Ultramicroscopy, 148:132–145, 2015. doi:10.1016/j.ultramic.2014.10.002.

[AHS+20]

Håkon W. Ånes, Jarle Hjelen, Bjørn E. Sørensen, Antonius T. J. van Helvoort, and Knut Marthinsen. Processing and indexing of electron backscatter patterns using open-source software. In IOP Conference Series: Materials Science and Engineering, volume 891, 012002. IOP Publishing, 2020. doi:10.1088/1757-899X/891/1/012002.

[AHvHM19]

Håkon W. Ånes, Jarle Hjelen, Antonius T. J. van Helvoort, and Knut Marthinsen. Electron backscatter patterns from Nickel acquired with varying camera gain. 2019. [Data set]. doi:10.5281/zenodo.3265037.

[AvHM22]

Håkon Wiik Ånes, Antonius T. J. van Helvoort, and Knut Marthinsen. Electron backscatter diffraction data and backscatter electron images from a cold-rolled and recovered Al-Mn alloy. May 2022. doi:10.5281/zenodo.6470217.